Date(s) - 12/02/2019
3:00 pm - 4:00 pm
The quality of the information transfer available utilizing a chronically implanted neural interface depends upon the quality of the device-tissue interface. Implanted electrodes offer unique opportunities for device design and performance; however, they demonstrate challenges in long-term reliability which we seek to address with engineering solutions. Specifically, high-density, high-fidelity neural interfaces require small electrode site areas; unfortunately, these electrodes typically have high initial performance, but significant performance loss weeks to months post-implant. Here we will discuss our efforts to elucidate and control this effect to develop high-performance, reliable neural interfaces for central and peripheral neural prostheses.
Dr. Kevin J. Otto received his BS Degree in Chemical Engineering from Colorado State University in 1997, his MS Degree in Bioengineering in 2002 and his PhD Degree in Bioengineering in 2003 from Arizona State University, Tempe. From 1997 to 2003, he was a Research Assistant in the Bioengineering Department, Arizona State University, where his work was in the areas of neural engineering and sensory neuroprosthetics. From 2003 to 2004 he was a Research Fellow in the Department of Biomedical Engineering, University of Michigan, Ann Arbor where his work focused on brain-machine interface systems and implantable devices. From 2004 to 2006 he was a Post-Doctoral Fellow in the Central Systems Laboratory in the Kresge Hearing Research Institute in the Department of Otolaryngology at the University of Michigan, Ann Arbor where his work focused on cochlear implants. He is currently a Professor in the J. Crayton Pruitt Family Department of Biomedical Engineering at the University of Florida. His research interests include neural engineering, device-tissue interfaces, and neurostimulation.